diff --git a/source/RMA/PPMU2.0/APT_APT32F0313_RMA_Report.md b/source/RMA/PPMU2.0/APT_APT32F0313_RMA_Report.md
index 124a287..4ddb0a2 100644
--- a/source/RMA/PPMU2.0/APT_APT32F0313_RMA_Report.md
+++ b/source/RMA/PPMU2.0/APT_APT32F0313_RMA_Report.md
@@ -9,7 +9,7 @@
 | 客户名称     | `APT`                  |
 | 待测芯片     | `APT32F0313`                    |
 | 测试类型     | `CP/FT`                |
-| 报告版本     | `V1.0`                |
+| 报告版本     | `DRAFT_V0.1`                |
 | 板卡编号     | ``              |
 
 ---
@@ -18,6 +18,7 @@
 工厂反应PPMU2.0板卡对APT32F0313进行CP测试时，出现Vnege_Trim测试项Fail的情况，且该异常跟随板卡迁移
 具体表现为：
 - Trim Code写入后，发送Measure指令从Tp管脚量得得电压与期望值不符，导致Code中二分法得出错误结果进而使得测试项出现Fail
+- 检查输出电压后发现该电压为Trim Code = 31时所对应的输出电压
 - 进一步细究后发现，通过执行一次Trim Code写入，写入固定Code后重复发送Measure指令并进行测量，可得到异常结果，并与前述异常结果相符，故可以得出该问题实际出现在Measure指令到Tp管脚测量中
 
 ---
@@ -52,52 +53,54 @@
 
 ### 2. 复现流程
 <!-- 按顺序记录关键操作 -->
-1. 直接运行工厂项目文件，发现
-
+1. 直接运行工厂项目文件，在排除Socket干扰后发现两张板卡都出现Fail现象
+2. 使用万用表测量出现异常时Tp管脚电压，与PPMU返回电压值一致，故可排除DC测量问题
+3. 更改DCLevel中的VOH电平至2.5V以下，则会出现14Pass, 17Fail的差异情况
+4. 测试项Fail为偶发现象，需要通过Loop/多次执行Trim Measure指令并测量Tp管脚才可复现Fail现象
+5. 两张板卡互换K7,发现板卡差异与K7相关
+6. 更换K7相关器件，发现板卡差异与器件
+7. 逐个交换器件，发现板卡差异与高压Level Shifter有关，且可能与Tck通道相关
 ---
 
 ## 五、实验结果
-### 关键数据记录
-| 测试点 | 预期值 | 实测值 | 偏差 | 单位 |
-|--------|--------|--------|------|------|
-| Vout   | 3.3    | 3.28   | -0.6% | V    |
-| I_max  | 2.0    | 2.15   | +7.5% | A    |
 
 ### 波形/现象记录
-**图1：上电冲击电流波形**  
-![](./images/inrush_current_20230501.png)  
-*注释：观测到XX μs的浪涌电流*
+**图1：Fail时波形**  
+![](../../_images/RMA/APT_Trim/Fail.jpg)  
+
+
+**图2：Pass/Fail波形对比**  
+![](../../_images/RMA/APT_Trim/Compare.jpg)  
+
+*对比可得两板卡Tck/Tdio几乎完全重合，Tstr有差异但需进一步分析*
+
+**图3：Pattern为X时波形**  
+![](../../_images/RMA/APT_Trim/Write+2.jpg)  
+ 
+![](../../_images/RMA/APT_Trim/Write_X.jpg)  
+
+**图4：14板卡高压Level Shifter丝印**  
+![](../../_images/RMA/APT_Trim/TAR.png)  
+*丝印为TAR*
+
+**图5：17板卡高压Level Shifter丝印**  
+![](../../_images/RMA/APT_Trim/TAF.png)  
+*丝印为TAF*
+
+
 
-**图2：高温测试红外热像**  
-![](./images/thermal_image_test3.jpg)  
-*注释：芯片最高温度达XX℃（环境XX℃）*
 
 ---
 
-## 六、问题分析
-<!-- 使用故障树等结构化方法 -->
-```mermaid
-graph TD
-A[异常现象] --> B[电源模块]
-A --> C[信号干扰]
-B --> D{排查方向1}
-C --> E{排查方向2}
-```
-
----
-
-## 七、结论与建议
-✅ **实验结论**  
-1. `<验证通过/未通过的指标>`
-2. `<关键发现>`
-
-⚠️ **解决建议**  
-- [ ] 建议1：`<硬件优化方案>`
-- [ ] 建议2：`<测试方法改进>`
+## 六、发现归纳
+1. 17板卡上高压Level Shifter与14板卡上高压Level Shifter存在差异，通过交换物料已经证明，可能与批次等有关，目前确认14板卡上其丝印皆为TAR,而17板卡上皆为TAF
+2. 目前除上述发现与差异外，未发现两板卡其他差异，对于当前FT的颗粒该测试项(Vnege_Trim)仍会出现Fail情况
+3. VOH影响测试结果问题仍未厘清
+4. VIH影响测试结果问题仍未厘清(可能与3有关？)
+5. Pattern为X时波形存在毛刺，但目前认为不影响实验结果
 
 ---
 
 ## 附件
-1. [原始数据文件](./data/rawdata_20230501.csv)
-2. [电路原理图](./schematics/v2.0_final.pdf)
-3. [测试视频](./videos/test_recording.mp4)
\ No newline at end of file
+1. [Fail波形文件](../../_static/data/RMA/PPMU2.0/APT_Trim/Fail_ALL.csv)
+2. [Pass波形文件](../../_static/data/RMA/PPMU2.0/APT_Trim/Pass_ALL.csv)
diff --git a/source/_images/PPMU2.0/APT_Trim/Write+2.jpg b/source/_images/PPMU2.0/APT_Trim/Write+2.jpg
deleted file mode 100644
index d373d0e..0000000
Binary files a/source/_images/PPMU2.0/APT_Trim/Write+2.jpg and /dev/null differ
diff --git a/source/_images/PPMU2.0/APT_Trim/Write_X.jpg b/source/_images/PPMU2.0/APT_Trim/Write_X.jpg
deleted file mode 100644
index 48580f7..0000000
Binary files a/source/_images/PPMU2.0/APT_Trim/Write_X.jpg and /dev/null differ
diff --git a/source/_images/PPMU2.0/APT_Trim/Compare.jpg b/source/_images/RMA/APT_Trim/Compare.jpg
similarity index 100%
rename from source/_images/PPMU2.0/APT_Trim/Compare.jpg
rename to source/_images/RMA/APT_Trim/Compare.jpg
diff --git a/source/_images/PPMU2.0/APT_Trim/Fail.jpg b/source/_images/RMA/APT_Trim/Fail.jpg
similarity index 100%
rename from source/_images/PPMU2.0/APT_Trim/Fail.jpg
rename to source/_images/RMA/APT_Trim/Fail.jpg
diff --git a/source/_images/RMA/APT_Trim/IMG_20260724_165413.jpg b/source/_images/RMA/APT_Trim/IMG_20260724_165413.jpg
new file mode 100644
index 0000000..7d10458
Binary files /dev/null and b/source/_images/RMA/APT_Trim/IMG_20260724_165413.jpg differ
diff --git a/source/_images/RMA/APT_Trim/IMG_20260724_165446.jpg b/source/_images/RMA/APT_Trim/IMG_20260724_165446.jpg
new file mode 100644
index 0000000..02437ae
Binary files /dev/null and b/source/_images/RMA/APT_Trim/IMG_20260724_165446.jpg differ
diff --git a/source/_images/RMA/APT_Trim/TAF.png b/source/_images/RMA/APT_Trim/TAF.png
new file mode 100644
index 0000000..6a2cd48
Binary files /dev/null and b/source/_images/RMA/APT_Trim/TAF.png differ
diff --git a/source/_images/RMA/APT_Trim/TAR.png b/source/_images/RMA/APT_Trim/TAR.png
new file mode 100644
index 0000000..563b2cd
Binary files /dev/null and b/source/_images/RMA/APT_Trim/TAR.png differ
diff --git a/source/_images/RMA/APT_Trim/Write+2.jpg b/source/_images/RMA/APT_Trim/Write+2.jpg
new file mode 100644
index 0000000..f046d90
Binary files /dev/null and b/source/_images/RMA/APT_Trim/Write+2.jpg differ
diff --git a/source/_images/RMA/APT_Trim/Write_X.jpg b/source/_images/RMA/APT_Trim/Write_X.jpg
new file mode 100644
index 0000000..6ab9133
Binary files /dev/null and b/source/_images/RMA/APT_Trim/Write_X.jpg differ